Material and Device Fabrication and Characterization
The Materials for Opto/Electronics Research and Education (MORE) Center at Case Western Reserve University is equipped with an array of over 20 operational tools, encompassing materials deposition, sample analysis and characterization, and cleanroom facilities. Discover a full listing of our available equipment on our iLab page. Our core equipment and research capabilities include:
Material and Device Fabrication
- Creation of solution-processable and vacuum-deposited thin and thick film materials.
- Complete device fabrication and testing within an integrated 25 ft glovebox system.
- Class 10000 cleanroom equipped with sub-micrometer ultraviolet lithography capabilities.
- Precision sub-100 nm scale electron beam lithography.
Sample Characterization
- Analysis of device and surface geometry, including roughness, height, morphology, thickness, and structure from millimeters to nanometers.
- Determination of materials structure and composition via ellipsometry and spectrophotometry.
- Assessment of optical characteristics such as reflection, transmission, and absorption.
- Mechanical properties evaluation, including microindentation, hardness, scratch, and wear analysis.
- Electronic properties measurements, including 4-point probe measurements and standard solar cell performance tests.
- Fluorescent and photo-luminescent material analysis through fluorometry.